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About
Nova Measuring Instruments Ltd. develops, produces and markets optical metrology solutions comprised of integrated process control metrology systems and stand-alone metrology used in the manufacturing process of semiconductors. Its products include metrology systems for thin film measurement in chemical mechanical polishing and chemical vapor deposition applications; optical and metal line thickness systems for use in post-copper chemical mechanical polishing applications and optical critical dimension systems for lithography and etch applications. The company was founded by Giora Dishon and Moshe Finarov in May 1993 and is headquartered in Ness-Ziona, Israel. | |||
Description
Nova Measuring Instruments Ltd. designs, develops, produces, and sells process control systems used in the manufacture of semiconductors in Israel. The company offers in-line and x-ray stand-alone metrology systems, as well as integrated optical metrology systems that attach directly to wafer fabrication process equipment. Its products include thin film and optical CD process control for dimensional, films, and material metrology measurements for process control across various semiconductor manufacturing process steps, including lithography, etch, chemical mechanical polishing, and deposition. The company serves various sectors of the integrated circuit manufacturing industry, including logic, ASIC, foundries, and memory manufactures, as well as end users and process equipment manufacturers worldwide. Nova Measuring Instruments Ltd. was founded in 1993 and is headquartered in Ness Ziona, Israel. |